Thickness Measurements below the Rayleigh Depth Resolution Limit Using Frequency-Modulated Continuous-Wave Millimeter and Terahertz Waves
- The nondestructive testing of multilayered materials is increasingly applied in both scientific and industrial fields. In particular, developments in millimeter wave and terahertz technology open up novel measurement applications, which benefit from the nonionizing properties of this frequency range. One example is the noncontact inspection of layer thicknesses. Frequently used measuring and analysis methods lead to a resolution limit that is determined by the bandwidth of the setup. This thesis analyzes the reliable evaluation of thinner layer thicknesses using model-based signal processing.
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| Author: | Nina Susan Schreiner |
|---|---|
| URN: | urn:nbn:de:hbz:386-kluedo-66663 |
| DOI: | https://doi.org/10.26204/KLUEDO/6666 |
| Advisor: | Ralph Urbansky |
| Document Type: | Doctoral Thesis |
| Language of publication: | English |
| Date of Publication (online): | 2021/11/29 |
| Year of first Publication: | 2021 |
| Publishing Institution: | Technische Universität Kaiserslautern |
| Granting Institution: | Technische Universität Kaiserslautern |
| Acceptance Date of the Thesis: | 2021/11/02 |
| Date of the Publication (Server): | 2021/12/02 |
| Page Number: | 126 |
| Faculties / Organisational entities: | Kaiserslautern - Fachbereich Elektrotechnik und Informationstechnik |
| DDC-Cassification: | 6 Technik, Medizin, angewandte Wissenschaften / 600 Technik |
| Licence (German): |  Creative Commons 4.0 - Namensnennung, nicht kommerziell, keine Bearbeitung (CC BY-NC-ND 4.0) |