Pattern Recognition Using Measure Space Metrics
- Patterns are considered as normalized measures and distances between them are defined as distances of the corresponding measures using metrics in measure spaces. This idea can be applied for pattern recognition if smeared patterns have to be compared with given ideal patterns. Different metrics are sensitive to different characteristics of the patterns - this is demonstrated in discussing examples. Particular attention is paid to a problem of Quality Control for an artificial fabric, where the distance to uniformity is defined and evaluated; the results are now used in industry.
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| Author: | Helmut Neunzert, B. Wetton |
|---|---|
| URN: | urn:nbn:de:hbz:386-kluedo-6297 |
| Series (Serial Number): | Berichte der Arbeitsgruppe Technomathematik (AGTM Report) (28) |
| Document Type: | Preprint |
| Language of publication: | English |
| Year of Completion: | 1987 |
| Year of first Publication: | 1987 |
| Publishing Institution: | Technische Universität Kaiserslautern |
| Date of the Publication (Server): | 1987/01/01 |
| Faculties / Organisational entities: | Kaiserslautern - Fachbereich Mathematik |
| DDC-Cassification: | 5 Naturwissenschaften und Mathematik / 510 Mathematik |
| Licence (German): |  Standard gemäß KLUEDO-Leitlinien vor dem 27.05.2011 |