Efficient Texture Analysis of Binary Images
- A new method of determining some characteristics of binary images is proposed based on a special linear filtering. This technique enables the estimation of the area fraction, the specific line length, and the specific integral of curvature. Furthermore, the specific length of the total projection is obtained, which gives detailed information about the texture of the image. The influence of lateral and directional resolution depending on the size of the applied filter mask is discussed in detail. The technique includes a method of increasing directional resolution for texture analysis while keeping lateral resolution as high as possible.
Author: | Joachim Ohser, Bernd Steinbach, Christian Lang |
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URN: | urn:nbn:de:hbz:386-kluedo-7161 |
Series (Serial Number): | Berichte des Fraunhofer-Instituts für Techno- und Wirtschaftsmathematik (ITWM Report) (8) |
Document Type: | Preprint |
Language of publication: | English |
Year of Completion: | 1998 |
Year of first Publication: | 1998 |
Publishing Institution: | Fraunhofer-Institut für Techno- und Wirtschaftsmathematik |
Date of the Publication (Server): | 2000/04/03 |
Faculties / Organisational entities: | Fraunhofer (ITWM) |
DDC-Cassification: | 5 Naturwissenschaften und Mathematik / 510 Mathematik |
Licence (German): | Standard gemäß KLUEDO-Leitlinien vor dem 27.05.2011 |