A Platform for Analyzing DDR3 and DDR4 DRAMs
- The authors explore the intrinsic trade-off in a DRAM between the power consumption (due to refresh) and the reliability. Their unique measurement platform allows tailoring to the design constraints depending on whether power consumption, performance or reliability has the highest design priority. Furthermore, the authors show how this measurement platform can be used for reverse engineering the internal structure of DRAMs and how this knowledge can be used to improve DRAM’s reliability.
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| Author: | Matthias Jung, Deepak M. Mathew, Carl C. Rheinländer M.Eng., Christian Weis, Norbert Wehn |
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| URN: | urn:nbn:de:hbz:386-kluedo-52834 |
| Document Type: | Conference Proceeding |
| Language of publication: | English |
| Date of Publication (online): | 2018/05/30 |
| Year of first Publication: | 2018 |
| Publishing Institution: | Technische Universität Kaiserslautern |
| Date of the Publication (Server): | 2018/06/04 |
| Tag: | DRAM; Measurement; Reverse Engineering |
| Page Number: | 8 |
| Source: | http://ieeexplore.ieee.org/document/7930528/ |
| Faculties / Organisational entities: | Kaiserslautern - Fachbereich Elektrotechnik und Informationstechnik |
| CCS-Classification (computer science): | B. Hardware / B.3 MEMORY STRUCTURES / B.3.1 Semiconductor Memories (NEW) (B.7.1) / Dynamic memory (DRAM) (NEW) |
| DDC-Cassification: | 6 Technik, Medizin, angewandte Wissenschaften / 621.3 Elektrotechnik, Elektronik |